Interested in joining our team? We are seeking qualified applicants for Metrology and Quality Engineering positions. Please send resumes that include salary requirements, job history, and work related experience to email@example.com
REDEFINING THE SCIENCE OF MEASUREMENT
At OMNIA Scientific, we know that seeing is good, but seeing everything is better. Our state-of-the-art Industrial CT scanning capabilities, powerful dimensional imaging software, and talented team of engineers combine plastics manufacturing expertise and metrology to drive solutions where plastic part validation is critical.
THE OMNIA DIFFERENCE
Omnia Scientific differs from traditional metrology institutes by combining industry expertise in polymer science, manufacturing, and metrology. Our engineers do not simply measure parts and provide dimensional data, but also a complete metrology review - from material selection to end use application, our metrology review documents critical validation and inspection analysis and where applicable, substitute materials, failure correction, optimal manufacturing strategies, accelerated qualification pathways, and plastic part forensics.
We start by reviewing your plastic part, understanding design intent, evaluating the material and end use or clinical application, and manufacturing or tooling process. Then we build the fixtures, algorithms, and repeatable processes to capture data.
Our metrology review combines data and analytics to provide documentation on your dimensional inspection, corrective courses of action when necessary, forensics, and leads to a complete validation package.
After capturing the data, validation is performed by analyzing:
INDUSTRIAL CT SCANNING
"At OMNIA SCIENTIFIC, what makes us different is the way we see Metrology."
INDUSTRIAL CT SCANNING
Industrial computed tomography (CT) gives you entirely new insights by making it possible to capture the volume of all internal structures in near real-time. CT is an important component in reliable product and process development and also process monitoring and qualification. Based on a 3D volume model, CT provides comprehensive internal and external data at high resolutions between 3.5–6 μm. Because CT is non-destructive, it is significantly faster than contact measurement, and can be used where optical and traditional measuring techniques are not possible.
Data generated from CT can be applied to a broad range of applications including:
First Article Inspection
Wall Thickness Analysis
Nominal / Actual Comparison